BPI-107 Statistical Process Control (SPC)
Statistical process control is one of the core tools deployed by IATF 16949, it is a process improvement tools which apply the control charts to monitor the key process parameters capability and stability.
Dr. Walter A. Shewhart of Bell Telephone Laboratories developed the first control chart in the early 1920s. Since then Control charts have been used by industries worldwide, and it is proven method for defect prevention and waste reduction.
Dr. Walter A. Shewhart of Bell Telephone Laboratories developed the first control chart in the early 1920s. Since then Control charts have been used by industries worldwide, and it is proven method for defect prevention and waste reduction.
- The understanding of the SPC concepts.
- The knowledge in monitor and interpreting the control chart patterns
- The knowledge to develop variable and attribute control charts.
- The concept and practical approach to process capability analysis (Ppk & Cpk).
- Introduction to SPC
- Basic Statistical Concepts
- Data Collect Strategy
- Control Chart Analysis
- Variables Control Charts
- Attributes Control Charts
- Process Capability Analysis
This course is designed for managers, engineers, executives, supervisors or anyone who wish to perform SPC into their workplace.
This is a 2-days programme.
This course runs from 9:00am – 5:00pm with an hour for lunch and periodic short breaks.
This is an intensive session designed to include as much discussion as possible. Lunch and breaks provide an opportunity for further questioning and discussion with the instructors.
This course runs from 9:00am – 5:00pm with an hour for lunch and periodic short breaks.
This is an intensive session designed to include as much discussion as possible. Lunch and breaks provide an opportunity for further questioning and discussion with the instructors.
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